Scanning Electron Microscope (SEM) with EDS

Overview: The Phenom ProX Scanning Electron Microscope (SEM) with Energy Dispersive Spectroscopy (EDS) provides high-resolution surface imaging and comprehensive elemental analysis, ideal for materials characterization at the micro- and nanoscale.

Key Features:

• High-resolution SEM imaging
• Integrated EDS for detailed chemical composition analysis
• User-friendly interface for seamless operation
• Fast imaging with minimal setup time

Technical Specifications:

• wavelength range: Not applicable for SEM
• resolution: ≤6 nm (SED), ≤8 nm (BSD)
• magnification: 160–350,000x
• numerical aperture: Not applicable for SEM
• detection limit: Elemental detection down to Boron (B)
• scan speed: 30 seconds from loading to imaging

Applications: Suitable for industrial users requiring detailed elemental analysis, research facilities expanding capabilities, and educational purposes.