The Technoorg-Linda UniMill (Model IV7) is a versatile and fully automated ion beam thinning system designed for extremely rapid preparation of high-quality TEM/XTEM (Transmission Electron Microscopy/Cross-sectional Transmission Electron Microscopy) samples. It is particularly effective for achieving electron transparency on conductive specimens (e.g., 3 mm discs). The system features two independently controlled Ar+ ion sources: a high-energy gun (up to 16 keV, 500 μA) for fast thinning and a low-energy gun (100 eV - 2 keV, 7-80 μA) for final polishing and gentle cleaning of redeposited materials and amorphized layers, minimizing surface damage. The UniMill provides high beam current densities and is controlled by an easy-to-use graphical interface, allowing for storage and pre-programming of milling parameters including electrode voltages, gas flow, and sample motion/tilt. It offers sample cooling options (e.g., liquid nitrogen) for beam-sensitive specimens and features fast, motorized sample exchange via a load-lock system, which helps maintain vacuum levels and save time.