Scanning Electron Microscope

The Hitachi SU3900 SEM enables imaging at low and high magnifications using secondary electrons, backscattered electrons, X-rays, and cathodoluminescence. Equipped with dual Bruker XFlash7 30mm² SDD EDS for high-speed mapping, built-in Hitachi UVD CL detector, and DELMIC SPARC Compact color-filtering CL detector. Supports variable pressure mode and automated mineralogy with Bruker AMICS.