
The Hitachi SU3900 SEM enables imaging at low and high magnifications using secondary electrons, backscattered electrons, X-rays, and cathodoluminescence. Equipped with dual Bruker XFlash7 30mm² SDD EDS for high-speed mapping, built-in Hitachi UVD CL detector, and DELMIC SPARC Compact color-filtering CL detector. Supports variable pressure mode and automated mineralogy with Bruker AMICS.

Faculty of Science
Research lab focused on advancing scientific knowledge and innovation.
The Hitachi SU3900 SEM enables imaging at low and high magnifications using secondary electrons, backscattered electrons, X-rays, and cathodoluminescence. Equipped with dual Bruker XFlash7 30mm² SDD EDS for high-speed mapping, built-in Hitachi UVD CL detector, and DELMIC SPARC Compact color-filtering CL detector. Supports variable pressure mode and automated mineralogy with Bruker AMICS.


Faculty of Science
Research lab focused on advancing scientific knowledge and innovation.
Discover more resources that could support your research