
This instrument measures thin film thickness, refractive index, and optical properties with high spatial resolution, enabling the characterization of microstructured or patterned surfaces.

Faculty of Engineering
Research lab focused on advancing scientific knowledge and innovation.
This instrument measures thin film thickness, refractive index, and optical properties with high spatial resolution, enabling the characterization of microstructured or patterned surfaces.


Faculty of Engineering
Research lab focused on advancing scientific knowledge and innovation.
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