EquipmentAvailable
Oxford Instruments MFP-3D Origin+ Atomic Force Microscope (AFM)
Faculty of Engineering
Mechanical Engineering
McGill University
The Oxford Instruments MFP-3D Origin+ AFM offers high-resolution surface characterization capabilities, enabling detailed analysis of surface topography, mechanical properties, and material behaviors at the nanoscale. This instrument is essential for studies requiring precise surface measurements and manipulation.
McGill Nanofactory
Faculty of Engineering
Research lab focused on advancing scientific knowledge and innovation.
CC
Changhong Cao
EquipmentAvailable
Oxford Instruments MFP-3D Origin+ Atomic Force Microscope (AFM)
Faculty of Engineering
Mechanical Engineering
McGill University
The Oxford Instruments MFP-3D Origin+ AFM offers high-resolution surface characterization capabilities, enabling detailed analysis of surface topography, mechanical properties, and material behaviors at the nanoscale. This instrument is essential for studies requiring precise surface measurements and manipulation.
McGill Nanofactory
Faculty of Engineering
Research lab focused on advancing scientific knowledge and innovation.
CC
Changhong Cao
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