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    EquipmentAvailable

    Bruker DektakXT stylus profilometer

    Contact stylus measurement of step heights, surface features and roughness of thin films, from about 10 nm to 1 mm, plus larger-area surface maps.

    US$12.50 to US$68 / hourAll ratesView pricing

     

    The instrument

    We use the DektakXT to measure step heights and surface features of thin films, and surface roughness. It measures from approximately 10 nm to 1 mm, with a vertical resolution of 1 Å in the smallest range, and can run larger-area surface mapping scans.

    The stylus touches your sample as it scans, so very soft materials can be damaged. We have 12 µm and 2 µm stylus tips, which are interchangeable.

    Rates

    Boise State researchers
    US$12.50 / hour
    Commercial
    US$68 / hour
    Everyone else
    US$18 / hour

    View pricing

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    Features

    Equipment CalendarProtocol CortexCRMImpact Reporting

    Explore

    Research IndexTechniquesCommunityPlans

    In partnership with

    McGill UniversityConcordia UniversityUniversité de MontréalPolytechnique MontréalDobson Centre for EntrepreneurshipUniversity of Alberta
    © 2026 LabGiant
    EN|FR
    Privacy PolicyTerms of Service