EquipmentAvailable
Hitachi S-3400N-II Scanning Electron Microscope (SEM)
Faculty of Engineering
Mechanical Engineering
McGill University
The Hitachi S-3400N-II SEM is designated for in-situ mechanical characterizations using Micro-Electro-Mechanical Systems (MEMS) and miniaturized tensile testers. It provides high-resolution imaging and analysis of microstructures, facilitating research in material science and mechanical engineering.
McGill Nanofactory
Faculty of Engineering
Research lab focused on advancing scientific knowledge and innovation.
CC
Changhong Cao
EquipmentAvailable
Hitachi S-3400N-II Scanning Electron Microscope (SEM)
Faculty of Engineering
Mechanical Engineering
McGill University
The Hitachi S-3400N-II SEM is designated for in-situ mechanical characterizations using Micro-Electro-Mechanical Systems (MEMS) and miniaturized tensile testers. It provides high-resolution imaging and analysis of microstructures, facilitating research in material science and mechanical engineering.
McGill Nanofactory
Faculty of Engineering
Research lab focused on advancing scientific knowledge and innovation.
CC
Changhong Cao
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