Overview: The Imaging Ellipsometer / Brewster Angle Microscope is designed for precise measurement of thin film thickness, refractive index, and surface properties using advanced ellipsometry and Brewster angle microscopy techniques. It is ideal for nanoscale interface characterization.

Key Features:

• Combines ellipsometry and microscopy for detailed surface analysis
• Real-time visualization of surface properties
• High-resolution imaging capabilities

Technical Specifications:

• wavelength range: 360 nm to 1000 nm
• resolution: 0.01 nm
• magnification: 2x to 50x
• numerical aperture: 0.95
• detection limit: 0.35 nm
• scan speed: 47 minutes for a full 4” wafer

Applications: Used in research for surface inspection, quality control, and characterization of microstructures and thin films.