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    EquipmentAvailable

    Dektak XT Profilometer

    Quote on request

     

    The instrument

    The Dektak XT Profilometer offers precise surface topography measurements, essential for thin-film characterization and materials science research.

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    Materials Characterization in MontrealMass Spectrometry in MontrealChromatography in MontrealImaging in MontrealResearch infrastructure in MontrealCore facilities at McGill University
    LabGiant,

    on the shoulders of giants.

    Features

    Equipment CalendarProtocol CortexCRMImpact Reporting

    Explore

    Research IndexTechniquesCommunityPlans
    McGill UniversityConcordia UniversityUniversité de MontréalPolytechnique MontréalDobson Centre for EntrepreneurshipUniversity of Alberta
    © 2026 LabGiant
    EN|FR
    Privacy PolicyTerms of Service