EquipmentAvailable
Dektak XT Profilometer
Faculty of Engineering
Chemical Engineering
McGill University
The Dektak XT Profilometer offers precise surface topography measurements, essential for thin-film characterization and materials science research.
Analytical Labs - McGill Chemical Engineering
Faculty of Engineering
Research lab focused on advancing scientific knowledge and innovation.
AG
Andrew Golsztajn
EquipmentAvailable
Dektak XT Profilometer
Faculty of Engineering
Chemical Engineering
McGill University
The Dektak XT Profilometer offers precise surface topography measurements, essential for thin-film characterization and materials science research.
Analytical Labs - McGill Chemical Engineering
Faculty of Engineering
Research lab focused on advancing scientific knowledge and innovation.
AG
Andrew Golsztajn
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