Overview: The MultiMode 8-HR Atomic Force Microscope (AFM) is designed for high-resolution imaging and analysis of nanoscale surface topography, mechanical properties, and force measurements, suitable for both materials and biological samples.

Key Features:

• High-resolution imaging capabilities
• Advanced environmental control with heating and cooling options
• PeakForce Tapping technology for enhanced imaging speed
• Versatile platform with open-access flexibility

Technical Specifications:

• wavelength range: Not applicable (AFM does not use optical wavelengths)
• resolution: Sub-nanometer resolution
• magnification: Not applicable (AFM does not use traditional magnification)
• numerical aperture: Not applicable (AFM does not use optical lenses)
• detection limit: Atomic scale detection
• scan speed: Up to 6X faster than conventional AFMs with PeakForce Tapping

Applications: Used in materials research, biology, and nanocharacterization for detailed molecular and structural analysis.