Overview: The MultiMode 8-HR Atomic Force Microscope (AFM) is designed for high-resolution imaging and analysis of nanoscale surface topography, mechanical properties, and force measurements, suitable for both materials and biological samples.
Key Features:
- High-resolution imaging capabilities
- Advanced environmental control with heating and cooling options
- PeakForce Tapping technology for enhanced imaging speed
- Versatile platform with open-access flexibility
Technical Specifications:
- wavelength range: Not applicable (AFM does not use optical wavelengths)
- resolution: Sub-nanometer resolution
- magnification: Not applicable (AFM does not use traditional magnification)
- numerical aperture: Not applicable (AFM does not use optical lenses)
- detection limit: Atomic scale detection
- scan speed: Up to 6X faster than conventional AFMs with PeakForce Tapping
Applications: Used in materials research, biology, and nanocharacterization for detailed molecular and structural analysis.