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The JEOL JXA-iHP200F is a state-of-the-art field emission electron microprobe equipped with 5 wavelength-dispersive X-ray spectrometers (WDS) and dual Bruker XFlash6 30mm² SDD EDS detectors. It features various analytical crystals including TAP, PETJ, LIF, large-sized TAPL, PETL, LIFL, and light element LDE1L, LDE6L. Supports X-ray element mapping, backscattered and secondary electron imaging, and automated mineralogy via Bruker AMICS software.
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