EquipmentDisponible
Oxford Instruments MFP-3D Origin+ Atomic Force Microscope (AFM)
Tarification
Demander un devis
Faculty of Engineering
Mechanical Engineering
McGill University
The Oxford Instruments MFP-3D Origin+ AFM offers high-resolution surface characterization capabilities, enabling detailed analysis of surface topography, mechanical properties, and material behaviors at the nanoscale. This instrument is essential for studies requiring precise surface measurements and manipulation.
McGill Nanofactory
Faculty of Engineering
Laboratoire de recherche voué à faire avancer les connaissances scientifiques et l'innovation.
CC
Changhong Cao
McGill Nanofactory · McGill UniversityEquipmentDisponible
Oxford Instruments MFP-3D Origin+ Atomic Force Microscope (AFM)
Tarification
Demander un devis
Faculty of Engineering
Mechanical Engineering
McGill University
The Oxford Instruments MFP-3D Origin+ AFM offers high-resolution surface characterization capabilities, enabling detailed analysis of surface topography, mechanical properties, and material behaviors at the nanoscale. This instrument is essential for studies requiring precise surface measurements and manipulation.
McGill Nanofactory
Faculty of Engineering
Laboratoire de recherche voué à faire avancer les connaissances scientifiques et l'innovation.
CC
Changhong Cao
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