Measures thin film thickness and optical constants (n and k) of dielectric, organic, semiconductor and metal films, from sub-nanometer layers up to tens of microns for transparent films.
US$15 to US$72 / hourAll ratesView pricing
The M-2000 measures thin film thickness and optical constants. It is sensitive to less than a monolayer of material on a surface and can determine thickness for transparent films up to tens of microns. It measures n and k for any type of material: dielectric, organic, semiconductor or metal.
Use it to assess material properties, map uniformity and run QC analysis.
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