TEM and STEM imaging, electron diffraction and chemical analysis by EDS and EELS, with in situ heating and cooling holders and crystal orientation mapping.
US$90 to US$200 / hourAll ratesView pricing
Our JEOL JEM-2100 HR images the internal structure of thin samples in TEM and STEM modes and analyzes their chemistry by EDS and EELS. Precession electron diffraction, automatic crystal orientation and phase mapping, and 3D diffraction tomography support crystallographic work, and a tomography unit reconstructs 3D images.
Holders heat samples up to 1273 K or cool them down to 77 K in situ. Our TEM sample preparation equipment covers ion beam thinning, ion slicing, jet polishing, dimple grinding and ultramicrotomy.
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