§01
The Work
Keywords
Electron Microscopy
Scanning Electron Microscopy
Materials Characterization
Low Voltage SEM
Cathode Materials
3D-FIB
+ 2 more
§02
Capabilities
10
Hitachi NX-5000 DUAL-FIB/SEM (Ethos)
Instrument
Hitachi SU-9000 CFE-SEM/STEM with EELS/EDS
Instrument
Hitachi SU-8230 CFE-SEM/STEM
Instrument
EMS Dimpler D500i
Instrument
EMS Q150TS Sputter Coater/Evaporator
Instrument
Technoorg-Linda UniMill Broad Ion Beam Milling System
Instrument
Hitachi IM-4000Plus Ion Milling System
Instrument
PIE Scientific Tergeo Plasma Cleaner
Instrument
LKB Nova Ultramicrotome
Instrument
Hitachi IM-3000 Flat-Ion Milling System
Instrument
McGill Electron Microscopy Research Group
Explorer l'infrastructure de recherche partagée
Microscopie à Montréal
Caractérisation des matériaux à Montréal
Infrastructure de recherche à Montréal
Plateformes de McGill University
